Transmission Electron Microscopes
Transmission Electron Microscopes
In a transmission electron microscope (TEM), a beam of electrons is transmitted
through an ultra-thin specimen, interacting with the material as it passes through.
For crystalline materials such as the minerals found in extraterrestrial samples,
the interaction between the electrons and the specimen allows direct imaging of the
atomic arrangement in mineral structures at scales ranging from a single column of
atoms up to crystal imperfections and defects several nanometers (nm) in size.
At the same time, the use of various X-ray and electron spectroscopy techniques also
available in the TEM provides information on the chemical composition and chemical
bonding on the same scale as the images. The combination of both capabilities provides
unique nanoscale information for studying the formation conditions and history of
astromaterials from the Moon, Mars, comets, and asteroids.
Laboratory Leads
|
Lindsay Keller
NASA 281-483-6090 |
Roy Christoffersen
Jacobs JETS II 281-244-8380 |
Brittany Cymes
Jacobs JETS II 281-244-6714 |
Laboratory Leads
|
Lindsay Keller
NASA 281-483-6090 |
|
Roy Christoffersen
Jacobs JETS II 281-244-8380 |
|
Brittany Cymes
Jacobs JETS II 281-244-6714 |
Electron Beam Laboratory Suite
The Electron Beam Laboratory Suite includes two scanning electron microscopes (SEM),
two transmission electron microscopes (TEM), two electron microprobes, one dual-beam
focused ion beam (FIB) instrument, one NanoSIMS 50L, and a one-of-a-kind laser microprobe.
These workhorse instruments are used to characterize all types of materials studied
within ARES, and virtually every research group makes frequent use of one or more
of these instruments while conducting research in support of the ARES mission.
Electron Beam Laboratories
Electron Beam Laboratories
Inside the Transmission Electron Microscopy Laboratory: NASA scientist Zia Rahman
behind the controls of the JEOL 2500SE, a high resolution transmission microscope that
produces images of astromaterials by passing electrons through an ultra-thin sample.