Focused Ion Beam
Focused Ion Beam
One of ARES hi-end analytical instruments is the Dual Beam Focused Ion Beam (FIB) system, which is one of Thermo Fisher/FEI's most versatile models, the Quanta 3D-FEG for 2D and 3D materials characterization and analysis.
FIB techniques are used in a variety of applications. The FIB can deposit material, drill holes, cut metal lines, prepare cross-sections for high magnifications Ion channeling contrast imaging, prepare thin cross-section samples for the TEM analysis and more.
Applications for the FIB include:
- Specimen preparation for SEM, TEM, AES, EDS, EBSD, Nano-SIMS, Atom Probe, etc.
- Ion channeling contrast imaging by capturing secondary or backscattered electrons
- Grain Size Analysis
- 3D imaging, characterization and modelling.
- Device modification - IC Circuit Editing/Debug
- Micro-machining - example: trimming AFM tips, drilling patterns to make optical gratings and lenses
The FIB offers increased capabilities for the investigation of meteorites, lunar samples, IDPs (interplanetary dust particles), star dust and asteroid samples and experimental samples synthesized in ARES high-temperature and high-pressure experimental labs. FIB systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them popular for a wide variety of applications including advanced circuit edit, and revealing below-the-surface defects in advanced materials and devices.
The Quanta 3D Series features three SEM imaging modes (high vacuum, low vacuum, and ESEM) to accommodate the widest range of samples of any SEM. Integrated FIB adds cross-sectioning capabilities to expand the applications range. ESEM mode allows in-situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500°C).
The ARES FIB is equipped with both in-situ and ex-situ lift-out capabilities and also equipped with two XEDS detectors for chemical analysis, which includes spectrum collection and qualitative and quantitative Elemental Mapping.
Laboratory Leads
Lindsay Keller
NASA 281-483-6090 |
Zia Rahman
Jacobs JETS II 281-483-7198 |
Laboratory Leads
Lindsay Keller
NASA 281-483-6090 |
Zia Rahman
Jacobs JETS II 281-483-7198 |
Electron Beam Laboratory Suite
The Electron Beam Laboratory Suite includes two scanning electron microscopes (SEM),
two transmission electron microscopes (TEM), two electron microprobes, one dual-beam
focused ion beam (FIB) instrument, one NanoSIMS 50L, and a one-of-a-kind laser microprobe.
These workhorse instruments are used to characterize all types of materials studied
within ARES, and virtually every research group makes frequent use of one or more
of these instruments while conducting research in support of the ARES mission.
Electron Beam Laboratories
Electron Beam Laboratories
Inside the Focused Ion Beam Laboratory: NASA scientist Zia Rahman behind
the controls of the Quanta 3D FEG, one of the most sensitive electron microscopy
systems for 2D and 3D analysis and characterization of astromaterials.