The new JEOL JXA-8530F electron probe, installed in early 2014 at NASA-JSC, is equipped with 5 WDS spectrometers, as well as a ThermoElectron SDD (Silicon drift detector) energy dispersive spectrometer. Several features of this instrument make it a state-of-the-art electron probe that will permit our researchers to attack problems in cosmochemistry that were previously intractable. The field emission electron gun enables significantly improved image resolution, permitting researchers to get a clearer view of fine-grained materials. The instrument is also equipped with two types of high-count-rate WDS detectors that yield substantially lower detection limits, permitting analysis of trace elements, but not requiring unreasonably long count times. We will develop low beam-energy analysis routines that will enable high-quality chemical analysis with much improved spatial resolution, allowing for analysis of finer-grained materials. The instrument is also equipped with several light-element-analysis diffracting crystals that will allow us to directly analyze carbon, nitrogen, and oxygen, that can be exploited to address the light element compositions of chondritic meteorites, in situ.
The purpose of the JEOL JXA-8530F electron probe is as follows:
Summary of new features that are significant advances over the old probe: